Course in Museum of Natural Sciences-CSIC

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Between September 10 and 12, 2019, XDS taught the course “X-Ray Dust Diffraction Course and Rietveld Method. Introduction to Difracc.EVA and TOPAS” at the Museum of Natural Sciences, belonging to the CSIC, in Madrid. During the 3 days of training, in addition to the theoretical sessions, the management of 2 DRX data processing programs were discussed: Diffrac.EVA and TOPAS.

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