Between 10th to 12th of September of 2019 XDS taught the course “Difracción de polvo de Rayos-X y el método de Rietveld. Introducción a Difracc.EVA y TOPAS” at Museo de Ciencias Naturales, from CSIC, in Madrid. During the 3 days of training, in addition to the theoretical sessions, the management of 2 XRD data processing programs were discussed: Diffrac.EVA and TOPAS.
Museum of Natural Sciences-CSIC Course
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